Characterization of cadmium sulphide thin films prepared by successive ionic layers adsorption and reaction method

Rajendra, B V and Fuchs, Benjamin and Kekuda, Dhananjaya (2012) Characterization of cadmium sulphide thin films prepared by successive ionic layers adsorption and reaction method. Journal of material Science: Materials in Electronics. ISSN 0957-4522

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Abstract

Cadmium sulfide (CdS) thin films were deposited on glass substrate at room temperature by successive ionic layer adsorption and reaction method (SILAR).The deposition parameters such as rinsing time,rinsing cycle and concentration of precursor solution were varied during the preparation of the samples. The structural characterization and optical characterization were carried out. The deposited films by lower growth rate and lower precursor concentration solutions were having mixed hexagonal and cubic phases. Thickness dependence of the optical band gap energy was evaluated and it varies from 2.46 to 2.32 eV in the thickness range 38–330 nm.

Item Type: Article
Uncontrolled Keywords: Cadmium sulphide, SILAR
Subjects: Engineering > MIT Manipal > Physics
Depositing User: MIT Library
Date Deposited: 27 Aug 2013 10:02
Last Modified: 27 Aug 2013 10:02
URI: http://eprints.manipal.edu/id/eprint/136916

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