Fourier-Transform Infrared Absorption Study of the Nanocluster Carbon Thin films Grown Using Cathodic Arc Process

Shounak, De and Satyanarayana, B S and Sharma, Shailesh and Rao, Mohan K (2010) Fourier-Transform Infrared Absorption Study of the Nanocluster Carbon Thin films Grown Using Cathodic Arc Process. In: AIP Conference Proceedings.

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Abstract

Nanocluster carbon thin films are deposited on Silicon Substrate using Cathodic Arc process. These films are mixed phased materials containing both sp2and sp3 bondings. The surface morphology is characterized by Fourier- Transform Infrared Spectroscopy (FTIR)to find out different vibrational modes in these films.The various bendings modes with Olefinic and aromatic structures are associated with a broad absorption band between 1130 and 1550 cm-1.The peaks in and around 2900 cm-1shows various stretching modes of C-Hn(n=1,2,3)

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: Nanocluster carbon thin film; Cathodic Arc; Infrared Absorption; Raman Spectroscopy.PACS:63.50.Lm, 78.30.ly
Subjects: Engineering > MIT Manipal > Electronics and Communication
Engineering > MIT Manipal > Physics
Depositing User: MIT Library
Date Deposited: 04 Jul 2014 06:21
Last Modified: 04 Jul 2014 06:21
URI: http://eprints.manipal.edu/id/eprint/140010

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