Comparative Power Analysis of LFSR Test Pattern Generators

Kamath, Srikanth H and Aakash , Nath and Kumar, Shobhit and Srivastava, . (2014) Comparative Power Analysis of LFSR Test Pattern Generators. International Journal of Computer Applications, 98 (8). pp. 37-39. ISSN 0975 – 8887

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Abstract

Automatic Test Pattern Generation Automatic Test Pattern Generator is an electronic de-sign automation method used to find an input sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The designs selected for comparison use LFSR as its core central component around which the entire algorithms are based which contribute in construction of Automatic test pattern generator. The LFSR is considered as it gives excellent random characteristics and has a low area overhead which allows it to be placed in the integrated circuit

Item Type: Article
Uncontrolled Keywords: LFSR, random, pattern, low power, four bits,
Subjects: Engineering > MIT Manipal > Electronics and Communication
Depositing User: MIT Library
Date Deposited: 18 Jul 2014 07:10
Last Modified: 18 Jul 2014 07:10
URI: http://eprints.manipal.edu/id/eprint/140179

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