X-Ray Diffraction Studies of CdxZn1-XS Thin Films Prepared by Spray Pyrolysis Technique

Raviprakash, Y and Bangera, Kasturi V and Shivakumar, G K (2013) X-Ray Diffraction Studies of CdxZn1-XS Thin Films Prepared by Spray Pyrolysis Technique. Advanced Materials Research, 620. pp. 340-344. ISSN 1662-8985

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Abstract

Thin films of CdxZn(1-x)S (0 ≤ x ≤ 1) were deposited on glass substrates by the chemical spray pyrolysis technique using a less used combination of chemicals. The variation of structural properties of these films in relation with composition was studied in detail. The entire study was made for a wide range of compositions of CdxZn (1-x) S thin films (x=0 to 1 in steps of 0.1). XRD studies reveal that all the films are polycrystalline with hexagonal (wurtzite) structure of which reflection peaks associated with (100), (002) and (110) planes were clearly identified for all the films and inclusion of cadmium into the structure of ZnS improved the crystallinity of the films. The value of lattice constants ‘a’ and ‘c’ was found to vary with composition from 0.382 to 0.415 nm and 0.625 to 0.675 nm respectively

Item Type: Article
Uncontrolled Keywords: Semiconducting thin films; Spray pyrolysis; XRD, Lattice parameters
Subjects: Engineering > MIT Manipal > Physics
Depositing User: MIT Library
Date Deposited: 04 Apr 2015 09:20
Last Modified: 04 Apr 2015 09:20
URI: http://eprints.manipal.edu/id/eprint/142333

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