Association of risk factors, Antimicrobial resistance trends, and occurrence of bla TEM, bla CTX M and bla SHV in Escherichia coli Causing Bacteremia.

Sinha, Richa and Kamath, Spurthi and Shenoy, Suchitra M (2016) Association of risk factors, Antimicrobial resistance trends, and occurrence of bla TEM, bla CTX M and bla SHV in Escherichia coli Causing Bacteremia. Infectious Disorders - Drug Targets, 16 (3). pp. 95-100. ISSN 22123989

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Abstract

Purpose: Escherichia coli are the most frequent cause of gram negative bloodstream infection. This study was done to evaluate the association of risk factors, antimicrobial susceptibility pattern and detection of TEM, SHV and CTX M genes

Item Type: Article
Uncontrolled Keywords: antibiotic pattern, bloodstream infection, escherichia coli, risk factors
Subjects: Medicine > KMC Mangalore > Microbiology
Depositing User: KMCMLR User
Date Deposited: 24 Jun 2016 12:26
Last Modified: 24 Jun 2016 12:26
URI: http://eprints.manipal.edu/id/eprint/146414

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