A study of microstructural properties and quantum size effect in SILAR deposited nano-crystalline CdS thin films

Ashith, V K and Rao, Gowrish K (2016) A study of microstructural properties and quantum size effect in SILAR deposited nano-crystalline CdS thin films. Thin Solid Films, 197 (203). pp. 197-203. ISSN 0040-6090

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Abstract

The paper reports deposition and characterization of CdS thin films by micro-controlled SILAR technique using CdCl2 and Na2S as precursors. The thickness of the films was found to increase with number of immersion cycles, and also with the concentration of precursor solutions. But this increase in thickness was observed only up to a certain limit beyond which films showed peeling effect. The films were found to be polycrystalline with cubic structure. The lattice constant, crystallite size and average strain on the films were found from detailed XRD analysis. Optical characterization revealed that the films exhibit quantum size effect due to their nano crystalline nature

Item Type: Article
Uncontrolled Keywords: Chalcogenides; Semiconductors; Chemical techniques; Thin films; Nanostructures
Subjects: Engineering > MIT Manipal > Physics
Depositing User: MIT Library
Date Deposited: 15 Oct 2016 12:04
Last Modified: 15 Oct 2016 12:04
URI: http://eprints.manipal.edu/id/eprint/147156

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