Morphological and Optical investigation of thermally evaporated ZnS thin films

Rashmitha, . and Mahesha, M G (2016) Morphological and Optical investigation of thermally evaporated ZnS thin films. In: International Conference on Materials Science and Technology, 05/06/2016, St. Thomas College Pala.

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ZnS thin film of thickness about 300nm was deposited by thermal evaporation under vacuum with base pressure 10-6 Torr on cleaned glass substrates. During the deposition, substrate was maintained at room temperature and the deposition was done at the optimized rate of 0.5nm/s. Detailed study of the structural and optical properties of the prepared thin film was carried out by means of XRD, AFM and UV-Vis spectrometry. From the XRD analysis, it is found that the film grown is polycrystalline in nature. The AFM images were captured for 2 μm x2 μm area and it revealed the uniform growth of the film. The optical properties were studied through UV-Visible transmittance spectra and the band gap energy was determined. Transmission spectra indicate a high transmission coefficient in the visible range. From Tauc plot, the band gap was found to be 3.45 eV.

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: ZnS PVD Optical
Subjects: Engineering > MIT Manipal > Physics
Depositing User: MIT Library
Date Deposited: 30 Jan 2017 13:31
Last Modified: 30 Jan 2017 13:31

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