Effect of electron beam irradiation on nonlinear optical properties of Al doped ZnO thin film

Pramodini, S and Poornesh, P (2016) Effect of electron beam irradiation on nonlinear optical properties of Al doped ZnO thin film. In: European Advanced Materials Congress 2016, 23/08/2016, Viking Line Cruise, Stockholm, Sweden.

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We report the studies on third-order nonlinear optical properties of Al doped ZnO thin films irradiated with electron beam at different dose rate. Al doped ZnO thin films were deposited on a glass substrate by spray pyrolysis deposition technique. The thin films were irradiated using the 8MeV electron beam from microtron ranging 1kGy to 5kGy. Nonlinear optical studies were carried out by employing the single beam Z-scan technique to determine the sign and magnitude of absorptive and refractive nonlinearities of the irradiated thin films. Continuous wave He–Ne laser operating at 633 nm was used as source of excitation. The open aperture Z-scan measurements indicated the sample displays reverse saturable absorption (RSA) process. The negative sign of the nonlinear refractive index n2 was noted from the closed aperture Z-scan measurements indicating the films exhibit self-defocusing property due to thermal nonlinearity. The third-order nonlinear optical susceptibility χ(3) varies from 8.17 x 10-5esu to 1.39 x 10-3esu with increase in electron beam irradiation. The present study reveals that the irradiation of electron beam leads to significant changes in the third order nonlinearity. For optical power limiting studies, the films were placed at the focal plane of the lens. Al doped ZnO displays good optical power handling capability with optical clamping of about ~5mW. The irradiation study endorses that the Al doped ZnO under investigation is a promising candidate photonic device applications such as all-optical power limiting.

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: ZnO; thin Films; Z-scan; NLO; Optical limiting.
Subjects: Engineering > MIT Manipal > Physics
Depositing User: MIT Library
Date Deposited: 30 Jan 2017 13:27
Last Modified: 30 Jan 2017 13:27
URI: http://eprints.manipal.edu/id/eprint/148227

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