Shettigar, Nayana and Pramodini, S and Kityk, I V and Abd-Lefdil, M and Eljald, E M and Regragui, M and Antony, Albin and Rao, Ashok and Sanjeev, Ganesh and Ajeyakashi, K C and Poornesh, P (2017) Tuning the third-order nonlinear optical properties of In:ZnO thin films by8 MeV electron beam irradiation. Journal of Physics and Chemistry of Solids, 110. pp. 260-265. ISSN 0022-3697
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Abstract
We report the third-order nonlinear optical properties of electron beam treated Indium doped ZnO (Zn1-xInxO (x ¼ 0.03) thin films at different dose rate. Zn1-xInxO (x ¼ 0.03) thin films prepared by spray pyrolysis deposition technique were irradiated using 8 MeV electron beam at dose rates ranging from 1 kGy to 4 kGy. X-ray diffraction patterns were obtained to examine the structural changes, The transformation from sphalerite to wurtzite structure of ZnO was observed which indicates occurrence of structural changes due to irradiation. Morphology of irradiated thin films examined using atomic force microscopy (AFM) technique indicates the surface roughness varying with irradiation dose rate. The switching over from Saturable Absorption (SA) to Reverse Saturable Absorption (RSA) behaviour was noted when the irradiation dose rate was increased from 1 kGy to 4 kGy. The significant changes observed in the third-order nonlinear optical susceptibility χ(3) of the Zn1-xInxO (x ¼ 0.03) thin films is attributed mainly due to electron beam irradiation. The study indicates that nonlinear optical parameterscan be controlled by electron beam irradiation by choosing appropriate dose rate which is very much essential for device applications. Hence Zn1-xInxO (x ¼ 0.03) materialize as a promising material for use in nonlinear optical device applications.
Item Type: | Article |
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Uncontrolled Keywords: | Zn1�xInxO (x ¼ 0.03) thin filmsNonlinear optics Electron beamZ-scan |
Subjects: | Engineering > MIT Manipal > Physics |
Depositing User: | MIT Library |
Date Deposited: | 21 Nov 2017 07:07 |
Last Modified: | 21 Nov 2017 07:07 |
URI: | http://eprints.manipal.edu/id/eprint/150010 |
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