Ramavenkateswaran, N and Sreelakshmi, K and Shounak, De and Satyanarayana, B S (2017) Modeling of nanocluster carbon defect states & thin film transistor. In: India International Conference on Power Electronics (IICPE), 17/11/2016, Thapar University, Patiala (Punjab).
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Abstract
Nano cluster carbons in its various forms like carbon nanotubes, fullerene and graphene have become attractive material for a wide range of application. The uniqueness of this, material is its ability to bond in different ways, including sp3, sp2 and
Item Type: | Conference or Workshop Item (Paper) |
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Uncontrolled Keywords: | amorphous silicon,defect states,space charge limited current, nanocluster carbon |
Subjects: | Engineering > MIT Manipal > Electronics and Communication |
Depositing User: | MIT Library |
Date Deposited: | 07 Dec 2017 04:37 |
Last Modified: | 07 Dec 2017 04:37 |
URI: | http://eprints.manipal.edu/id/eprint/150165 |
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