X-ray photoelectron spectroscopy, Raman and photoluminescence studies on formation of defects in Cu:ZnO thin films and its role in nonlinear optical features

Antony, Albin and Poornesh, P and Kityk, I V and Ozdg, K and Jedryka, J and Rakus, P and Wojciechowski, A (2018) X-ray photoelectron spectroscopy, Raman and photoluminescence studies on formation of defects in Cu:ZnO thin films and its role in nonlinear optical features. Laser Physics, 28 (9). 095405-095405. ISSN 1555-6611

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Abstract

The structural, optical, morphological and nonlinear optical properties of Cu:ZnO spray-coated films are studied. The surface morphology of Cu:ZnO thin films turned out to be homogenous, crack free and well covered with pea-shaped grains.

Item Type: Article
Uncontrolled Keywords: Cu:ZnO nanostructures, x-ray photoelectron spectroscopy (XPS), photoluminescence,Raman spectroscopy
Subjects: Engineering > MIT Manipal > Physics
Depositing User: MIT Library
Date Deposited: 07 Sep 2018 08:08
Last Modified: 07 Sep 2018 08:08
URI: http://eprints.manipal.edu/id/eprint/151918

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