Thickness Dependent Structural and Optical Properties of Thermally Evaporated Nano Crystalline SnS Thin Films

Raviprakash, Y and Vrinda, . and Jothsna, Nayana and Prathibha, . and Supreetha, Y S (2019) Thickness Dependent Structural and Optical Properties of Thermally Evaporated Nano Crystalline SnS Thin Films. In: International Conference on Materials Research and Applications, 11/03/2016, CMR Technical campus, Hyderabad.

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Abstract

Tin sulphide (SnS) is a promising material for use as an absorber layer in low cost solar cells particularly because of its nontoxic nature and absorption tunable bandgap in the visible range. In this work thin films of tin sulphide (SnS) of thickness range 40-200 nm have been deposited by thermal evaporation technique.The structural studies of the films were carried out using X-ray diffraction (XRD) technique. The Scanning Electron Microscopy (SEM) with EDAX is used to study the composition and surface morphology of the films. Optical properties of the thin films were studied using UV-visible spectrophotometer. SnS films exhibited a strong XRD peak that belongs to [004] orientation of the orthorhombic structured SnS crystal. It was observed that crystallinity improved with the increase of film thickness. Crystallite size varied from 31-43 nm. EDAX study showed that the films of higher thickness are more stoichiometric. Optical band gap of SnS films varied from 1.71 to 2.07 eV. The observed structural and optical properties of the films are discussed based on the thickness and compared with the few important published results. Also, the obtained results were discussed to assess the suitability of the SnS films for the fabrication of optoelectronic devices.

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: Thermal evaporation, Nano sized SnS thin films, Structural and optical properties, Thickness dependency
Subjects: Engineering > MIT Manipal > Physics
Depositing User: MIT Library
Date Deposited: 07 Feb 2019 05:23
Last Modified: 07 Feb 2019 05:23
URI: http://eprints.manipal.edu/id/eprint/153213

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