XPS analysis of ZnS0.4Se0.6 thin films deposited by spray pyrolysis technique

Krishna, Ganesha V S and Mahesha, M G (2021) XPS analysis of ZnS0.4Se0.6 thin films deposited by spray pyrolysis technique. Journal of Electron Spectroscopy and Related Phenomena, 249. ISSN 0368-2048

[img] PDF
12239.pdf - Published Version
Restricted to Registered users only

Download (2MB) | Request a copy
Official URL: http://www.elsevier.com/locate/elspec


XPS being important study for the analysis of chemical state and composition at the surface level along with the bonding between elements. XPS study was carried out for the optimized spray deposited ZnS0.4Se0.6 thin films, which is a prominent II–VI ternary chalcogenide optoelectronic material. Core spectra of Zn 2p, S 2p, Se 3d, and Se 3p were recorded for the analysis. As sulfur and selenium coexist in the sample, the detailed analysis of XPS is much needed. Analysis is challenging due to overlapping region of Se 3p peak and S 2p peak. Compared to previous reports, in the present sample, relatively lower charging effects were observed. The binding energies reported here could be used as reference for ZnSSe material. The composition of elements in the sample were also calculated, which agrees with the nominal composition.

Item Type: Article
Uncontrolled Keywords: Thin films Spray pyrolysis Ternary chalcogenides ZnSSe Photoelectron spectroscopy
Subjects: Engineering > MIT Manipal > Physics
Depositing User: MIT Library
Date Deposited: 02 Sep 2021 06:00
Last Modified: 02 Sep 2021 06:00
URI: http://eprints.manipal.edu/id/eprint/157203

Actions (login required)

View Item View Item